Cerritos, CA (PressExposure) October 04, 2011 -- Corelis, Inc., the leading supplier of high-performance JTAG test and measurement tools, announced today the USB-1149.1/CFM, a JTAG hardware platform that seamlessly integrates advanced boundary-scan test patterns into Teradyne in-circuit testers. The USB-1149.1/CFM is designed specifically for use with Teradyne TestStation and GR228x series testers. By utilizing the USB-1149.1/CFM with Corelis' ScanExpress family of JTAG software products, Teradyne users gain the benefit of:
High-speed 100 MHz clock rate boundary-scan test support
JTAG test vector reusability across multiple manufacturing test stations
Testing of IEEE-1149.6 AC-coupled digital networks
In-system programming of Flash and CPLD devices including direct SPI and I2C support
Fully automated boundary-scan test vector generation and execution
A powerful script engine to customize boundary-scan tests
The USB-1149.1/CFM is a single slot Custom Functional Module (CFM) form factor board that installs directly into one of four slots on a Teradyne Custom Function Board (CFB). Integration is simple and transparent; once installed in the system, the USB-1149.1/CFM JTAG, GPIO, I2C, and SPI signals are available to test fixtures and the tester backplane. Integrated SPI and I2C programming features make the USB-1149.1/CFM an ideal and universal solution for combined boundary-scan, JTAG embedded test, and in-system programming applications.
Harrison Miles, Director of Business Development at Corelis, states, "Requirements for boundary-scan solutions will continue to grow as a result of increasing PCB complexities and technology miniaturization. Adding boundary-scan to in-circuit testers represents a logical step for increasing system capability as high-speed buses and accessibility issues continue to become more prevalent."
"The USB-1149.1/CFM is designed specifically to ease boundary-scan deployment with existing Teradyne equipment," adds Ryan Jones, Senior Technical Marketing Engineer at Corelis. "Our solution delivers increased test coverage, faster test times, and lower overall costs, allowing customers to maintain a notable ROI on their Teradyne systems."
# # # #
Copyright © 2011 Corelis, Inc. All rights reserved.
All company and product names may be trade names, trademarks, or registered trademarks of the respective owners with which they are associated. Features, pricing, availability, and specifications are subject to change without notice.